Efficient Device and Integrated Circuit Statistical Modeling and Extraction Using a Bayesian Inference Framework

نویسندگان

  • L. Yu
  • I. Elfadel
  • D. A. Antoniadis
  • D. S. Boning
چکیده

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Risk Analysis of Operating Room Using the Fuzzy Bayesian Network Model

To enhance Patient’s safety, we need effective methods for risk management. This work aims to propose an integrated approach to risk management for a hospital system. To improve patient’s safety, we should develop flexible methods where different aspects of risk and type of information are taken into consideration. This paper proposes a fuzzy Bayesian network to model and analyze risk in the op...

متن کامل

Bayesian Estimation of Parameters in the Exponentiated Gumbel Distribution

Abstract: The Exponentiated Gumbel (EG) distribution has been proposed to capture some aspects of the data that the Gumbel distribution fails to specify. In this paper, we estimate the EG's parameters in the Bayesian framework. We consider a 2-level hierarchical structure for prior distribution. As the posterior distributions do not admit a closed form, we do an approximated inference by using ...

متن کامل

Bayesian Nonparametric and Parametric Inference

This paper reviews Bayesian Nonparametric methods and discusses how parametric predictive densities can be constructed using nonparametric ideas.

متن کامل

Functional Brain Response to Emotional Muical Stimuli in Depression, Using INLA Approach for Approximate Bayesian Inference

Introduction: One of the vital skills which has an impact on emotional health and well-being is the regulation of emotions. In recent years, the neural basis of this process has been considered widely. One of the powerful tools for eliciting and regulating emotion is music. The Anterior Cingulate Cortex (ACC) is part of the emotional neural circuitry involved in Major Depressive Disorder (MDD)....

متن کامل

Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering

Defects generated during integrated circuit (IC) fabrication processes are classified into global defects and local defects according to their generation causes. Spatial patterns of locally clustered defects are likely to contain the information related to their defect generation mechanisms. In this paper, we propose a model-based clustering for spatial patterns of local defects to reflect real...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2015